SPM SOLVER P47H-PRO features its versatility. The number of available measurement and influence methods and modes is huge. Scanning-by-probe scheme allows characterization of samples with sizes up to 100x100x20mm and weight 300 g. The model can be adopted for measurements in a controlled gas environment, in liquids, with sample heating up to 130°C. The AFM head can be easily removed for Stand Alone operation allowing samples with unlimited sizes to be measured.
Key features :
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Device has its own vibration isolation system for obtaining ultra-high resolution (up to atomic) without additional vibration isolation
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Capability of study of large samples with size up to100?100?20mm
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Scanning Tunnel Microscopy, Atomic-Force Microscopy and Shear Force (the method that allows using optical fiber as a probe) combined in one device
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Study in liquids, controlled gas environment and in temperatures up to 150 ? ?
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Interactive management system and software setting of modes and functional scheme of device
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Saving settings to separate files allows a beginner working with almost any of the available up-to-date methods of scanning probe microscopy
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Skilled user may design and implement his own methods, including multipass ones
Specifications : 
Applications :
- Materials Science
- Nanomanipulation
- Nanolithography
- Semiconductors
- Spectroscopy
- Optical and Magnetic Storage Development
- Thin Films
- Medicine and Biology
- Polymers.
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