Métrologie optique

Micro & Nanopositionnement

Produits de microscopie

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NT-MDT Ntegra Aura

Contrôle de l'environnement et vide primaire

AURA est le microscope qui permet de contrôler intégralement l'environnement ambiant de vos opérations. Avec AURA vous pouvez effectuer des opérations sous vide (jusqu'à 10-3Torr) ou sous atmosphère contrôlée . Il permet également de travailler à différentes température (de RT à 150°C) et de contrôler l'humidité. Optimisez les conditions ambiantes pour obtenir de meilleurs résultats!

 

NTEGRA Aura is a Scanning Probe Microscope for studies in the conditions of controlled environment and low vacuum.

The Q-factor of the cantilever in vacuum increases, thus gaining the sensitivity, reliability and accuracy of "probe-sample" light forces measurements. At that, the change from atmosphere pressure to 10-2 Torr vacuum provides the tenfold gain of Q-factor. By further vacuum pumping, Q-factor reaches its plateau and changes insignificantly. Thus, NTEGRA Aura presents the optimal "price/quality" ratio: comparing to the high-vacuum devices it needs much less time - only one minute - to get the vacuum that is needed for the tenfold Q-factor increase. At the same time the system is compact and easy to operate and maintain. As the NTEGRA platform product, NTEGRA Aura has built-in closed loop control for all the axes, optical system with 1 µm resolution and ability to work with more than 40 different AFM methods.
Due to the open architecture, the functionality of NTEGRA Aura can be widen essentially: specialized magnetic measurements with external magnetic field (horizontal, up to +/-0.2T; vertical, up to +/-0.02T), high-temperature experiments (heating up to 300 0 ? with temperature maintaining precision of 0.05 0 ?), etc.

 

Scanning probe Microscopy
STM/ AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging/Force Modulation/ Adhesion Force Imaging/ Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Force and Current), STM

 

Specifications

* Scanning head can be configured to serve as a stand-alone device for specimens of unlimited sizes.
** Optionally can be expanded to 200x200x20 um.
*** Built-in capacitive sensors have extremely low noise and any area down to 50x50 nm can be scanned with closed-loop control.

 

Applications

NTEGRA Aura  allows to carry out the research of surface characteristics with nanometric resolution and near-surface physical fields of various objects that can be placed into vacuum.

 

 

 

If you would like more information, please contact us.

 

 

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