For many industrial applications it is important to have an opportunity for studying large samples, saving the data arrays according to the prescribed algorithms in automatic mode. This may be used in the quality control of optical elements surfaces, e.g. undulation of lens surface, or the study of electric parameters in the determined fields of a 100 mm silicon substrate, or the testing of a big number of microsamples of polymer material while optimizing the conditions of chemical synthesis for the ideal combination of mechanical properties. Thus, the specialization of NTEGRA Maximus is the work with large samples and gathering of big data arrays in the automatic mode.
Specifications :
Applications :
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in scientific research in education, general metrology, studies of materials (studies of metal and alloy structures, molecular, polymer, semi-conductor, magnetic, nano-structural and other materials), in studies of semi-conductor instruments, thin film properties, development of information carrier mediums, including Tb memory, manipulations at nanometric level;
- in industry in semiconductor wafers production, in microelectronics, compact disk production, in metallurgy and metal processing, optical industry, material surface quality analysis, medicine and medical industry, production of powder material, paints, coating, production of data carriers and reading/recording devices for high capacity data storage devices.
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