NTEGRA Therma is the SPM with the lowest level of thermal drifts. In every Scanning Probe Microscope there is a certain thermal drift - an uncontrolled shifting of the probe relative to the sample, which is caused by the existence of temperature gradients. The irregular scaling of parts of the device leads to mutual shifting of the probe and the sample in time. In commercial SPMs the drift is usually about 20-50 nm per hour. This sort of the drift is not critical in case the investigations are carried out on big fields. But for the tasks where the scan size totals in tens of nanometer, the thermal drift becomes a crucial aspect. If there is a key object of investigation on a small scanning field, e.g. nanoparticle, and one needs to obtain series of images of this very nanoparticle in every 30 minutes, there is no commercial SPM, which can do this. NanoLaboratory NTEGRA Therma is the only system, which is capable of performing this task. The influence of temperature gradients has a huge meaning in the cases when the sample's temperature must be changed during the investigation process. The range of uncontrolled shifting in this case is about 50-300 nm per K, i.e. when heating or cooling a sample for 10° one must be ready to see the drift up to 3 µm. NanoLaboratory NTEGRA Therma was designed as SPM with the lowest possible level of thermal drifts. The thermal drift in NTEGRA Therma is less than 10 nm per K. That is owing to the symmetry of construction of the measuring unit, thorough selection of materials taking into account their coefficient of thermal expansion and because of double contour of inner heat setting.
It is impossible to avoid thermal drifts completely but the originality of NTEGRA Therma is in the mutual shifting of the probe and the sample for changing temperatures, which minimizes the influence of the temperature on the quality of obtained SPM data.
| Scanning probe Microscopy |
| STM/ AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging/Force Modulation/ Adhesion Force Imaging/ Magnetic Force Microscopy/ Electrostatic Force Microscopy/ Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Force and Current), STM |
Specifications :
* Scanning head can be configured to serve as a stand-alone device for specimens of unlimited sizes.
** Optionally can be expanded to 200x200x20 ?m.
*** For temperature range -30°C - +80°C
**** Built-in capacitive sensors have extremely low noise and any area down to 50x50 nm can be scanned with closed-loop control.
Applications :
NTEGRA Therma is used for carrying out of measurements by contact and semi-contact methods with heating a sample up to 200°C.
NTEGRA Therma is used for work with Polymers and Thin Organic Films:
- Spherulites and dendrites
- Polymer monocrystals
- Polymer nanoparticles
- LB-films
- Thin organic films
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