Métrologie optique

Micro & Nanopositionnement

Produits de microscopie

English version

NT-MDT Solver platform


Scanning Probe Microscope (SPM) platform is designed for the study of properties of the surface at nanometer scale. It allows visualizing and perform quantitative measurements of mechanical (hardness, elasticity, viscidity), electrical (conductivity, capacity, distribution of surface charge) and magnetic properties of the sample working with sizes from several microns to angstrom. Solver can operate with more than 40 measuring methods, which may be carrying out in air as well as in the controlled atmosphere and liquids.


Solver Next
Solver Smena
Solver P47-PRO

Solver P47H-PRO

Solver PRO-M

Solver HV-MFM


If you would like more information, please contact us.



Accueil - Nos produits - Nous contacter - Conditions générales de vente
© Optophase 2006-2014